专利名称:Method of fabricating polysilicon film by
excimer laser annealing process
发明人:Chu-Jung Shih,I-Min Lu申请号:US10248361申请日:20030114公开号:US06740569B2公开日:20040525
专利附图:
摘要:A method of fabricating a polysilicon film by an excimer laser annealing processis introduced. First, an amorphous silicon film is deposited on a substrate composed ofglass. The amorphous silicon film includes a first region, which is located in the center,
with a first thickness, and a second region, which is located in the periphery, with a slantsidewall. The thickness of the amorphous silicon film is measured so as to obtain theprofile of the sidewall in the second region. According to the profile of the sidewall, apre-cursor region is determined for performing an excimer laser annealing processwherein a second thickness in the boundary of the pre-curser regionis smaller than thefirst thickness so as to increase area of produced polysilicon film.
申请人:TOPPOLY OPTOELECTRONICS CORP.
代理人:Winston Hsu
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